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      • Our WEEE Policy
    • Careers
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      • Optics
      • Other applications
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      • Silicon
      • Silicon Carbide
      • Sapphire
      • Gallium Arsenide
      • Cadmium Zinc Telluride
      • Indium Phosphide
      • Rock/Soil
      • Other Materials
  • Products & Solutions
    • Lapping & Polishing
    • Chemical Polishing & Chemical Mechanical Polishing
    • Driven Head Lapping & Polishing Tools
    • Bonding & Impregnation Units
    • Test & Measurement
    • Cutting & Sawing
    • Accessories
    • Consumable Items
    • Consumables Store
  • Knowledge base
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Home  /  View our Lapping & Polishing Systems  /  PLJ Precision Lapping Jigs

PLJ Precision Lapping Jigs

Categories: Accessories, View All, View our Lapping & Polishing Systems
  • PLJ Precision Lapping Jigs
  • Description
  • Facilities Requirement
  • Applications
  • Accessories & Consumables

Description

Logitech PLJ precision lapping jigs are used to hold multiple “wafer geometry” or slide mounted specimens, while they are being processed on a Logitech Precision Lapping Machine.

The PLJ Precision Lapping Jigs allow specimens to be automatically lapped to a high degree of parallelism due to the automatic shutdown feature.

The robust construction of the jigs ensure they are suitable for both research and production environments, across a wide range of applications.

Specifications: PLJ2  PLJ7 
Weight: 5.5kg 12kg
Height: 208mm (8.2″) 231mm (9.1″)
Outside diameter: 127mm (5″) 188mm (7.4″)
Max specimen size: As chuckface pattern 152mm x 102mm (6″ x 4″)
Max specimen diameter: 102mm (4″) 152mm (6″)
Max substrate diameter: 105mm (4.1″) 167mm (6.6″)
Achievable parallelism: 2µm over 102mm (4″) 4µm over 152mm (6″)
Thickness control: ± 2µm ±2 µm

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Key Features

  • Preset thickness control and automatic parallelism
  • Vacuum chuck sample location
  • Preset process shutdown
  • Precision and versatility
  • Large format capability (PLJ7)
Specifications: PLJ2  PLJ7 
Weight: 5.5kg 12kg
Height: 208mm (8.2″) 231mm (9.1″)
Outside diameter: 127mm (5″) 188mm (7.4″)
Max specimen size: As chuckface pattern 152mm x 102mm (6″ x 4″)
Max specimen diameter: 102mm (4″) 152mm (6″)
Max substrate diameter: 105mm (4.1″) 167mm (6.6″)
Achievable parallelism: 2µm over 102mm (4″) 4µm over 152mm (6″)
Thickness control: ± 2µm ±2 µm
Chuckface pattern Sample size
PLJ2a Four 25x75mm slides or two 50x75mm slides or one 75x110m slide.
PLJ2c Six 28x48mm slides or two 25x75mm slides plus three 28x48mm slides or one 50x75mm slide plus three 28x48mm slides.
PLJ2f Six 30x45mm slides or three 45x60mm slides or one 60x90mm slides plus two 30x45mm slides.
PLJ7 One 100x150mm slides or four 50x75mm slides.

Geological Sciences

geologicalsciences

In many areas of geological study such as mineralogy, petrography and sedimentology you are required to analyse the characteristics of the materials such as soil or rock. To be able to do this a thin section needs to be prepared for microscopic examination.

Logitech precision equipment is ideal for thin or ultra-thin section preparation. Our wide range of versatile systems enable you to trim, lap and polish geological thin sections such as rock, coal, concete and soils.

Each of our systems are fully supported by a wide range of accessories and consumables, such as abrasive powders, polishing cloths and mounting media.

Optics

optics

The importance of optical polishing and the processing of optical components has never been greater with the ongoing development of the telecommunications market. Whether for Infra Red and polymer waveguide production or fibre optic cable polishing.

The precision design and manufacture of our equipment enable you to obtain maximum results from the cutting, lapping and polishing of these optical materials.

Other Applications

otherapplications

Logitech systems are used by organisations across the world for many different complex sample preparation processes.

Including the thin section preparation of; Teeth, Bone, Otoliths, Ceramics, Metals, Alloys, Polymers and other Carbon-based materials.

Weights and Pressure Blocks

weightsandpressureblocks

Logitech supply weights and pressure blocks for use with Logitech lapping systems.

Vacuum Chuck Mounting Blocks

Vacuum Chuck Mounting Blocks provide an ideal means of holding specimens for polishing operations, where no thickness control or angular adjustment is required.

Sample Loading Gauge

The Logitech Sample Loading Gauge provides an accurate means for measuring the load exterted by a jig on a sample up to 102mm (4″)

Aluminium Oxide Powder

Calcined Aluminium Oxide powders for lapping and polishing hard materials.

Silicon Carbide Powders

For use in high precision lapping and polishing operations. Available in a wide range of grit sizes.

Boron Carbide Lapping Powder

Boron Carbide is used for the processing of ceramics, sapphire, heat treated alloys and very hard minerals.

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